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This paper presents the heteroepitaxial growth of ultrawide bandgap β-Ga2O3 thin films on c-plane sapphire substrates by low pressure chemical vapor deposition. N-type conductivity in silicon (Si)-doped β-Ga2O3 films grown on sapphire substrate is demonstrated. The thin films were synthesized using high purity metallic gallium (Ga) and oxygen (O2) as precursors. The morphology, crystal quality, and properties of the as-grown thin films were characterized and analyzed by field emission scanning electron microscopy, X-ray diffraction, electron backscatter diffraction, photoluminescence and optical, photoluminescence excitation spectroscopy, and temperature dependent van der Pauw/Hall measurement. The optical bandgap is ∼4.76 eV, and room temperature electron mobility of 42.35 cm2/V s was measured for a Si-doped heteroepitaxial β-Ga2O3 film with a doping concentration of 1.32 × 1018 cm−3.
Applied Physics Letters
© 2016 Author(s). Published by AIP Publishing.
Rafique, Subrina; Han, Lu; French, Roger H.; and Zhao, Hongping, "Heteroepitaxy of N-type β-Ga2O3 Thin Films on Sapphire Substrate by Low Pressure Chemical Vapor Deposition" (2016). Faculty Scholarship. 74.